• DocumentCode
    2738516
  • Title

    Field Emission Properties of Carbon Nanotube Thin Films Grown on Different Substrate Materials

  • Author

    Sinha, N. ; Sun, Y. ; Yeow, J.T.

  • Author_Institution
    Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    270
  • Lastpage
    273
  • Abstract
    The electron field emission characteristics from multiwalled carbon nanotube (MWNT) films grown on two different substrate materials have been studied in this paper. The MWNT films were grown on a flat conductor surface (stainless steel) and a flat insulator surface (quartz). The field emission experiments were carried out under a diode configuration. It was found that the film on the quartz surface exhibits better emission capability, while the film on the stainless steel surface shows better emission stability. Energy-dispersive X-ray spectroscopy analysis revealed that carbon atoms evaporated and deposited on the surface of anode during field emission, which is in agreement to studies previously reported in literature. It is estimated that the degradation was due to local heating of tips of CNTs, leading to evaporation and deposition of carbon atoms during the field emission process.
  • Keywords
    X-ray chemical analysis; carbon nanotubes; electron field emission; thin films; C; FeCrCJk; SiO2; anode surface; carbon nanotube; emission capability; energy-dispersive X-ray spectra; field emission properties; flat conductor surface; flat insulator surface; heating; quartz; stainless steel; thin film growth; Atomic layer deposition; Carbon dioxide; Carbon nanotubes; Conducting materials; Conductive films; Electron emission; Organic materials; Steel; Substrates; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.86
  • Filename
    4617068