Title :
Thermal and Electrical Transport in Carbon Nanofiber Interconnects
Author :
Saito, Tsutomu ; Kitsuki, Hirohiko ; Suzuki, Makoto ; Yamada, Toshishige ; Fabris, Drazen ; Yang, Cary Y.
Author_Institution :
Center for Nanostruct., Santa Clara Univ., Santa Clara, CA
Abstract :
To carry out a systematic reliability study of carbon nanofibers (CNFs) under high-current stress, detailed electrical analysis of CNF breakdown is performed on four configurations using current annealing. This investigation can be described with a heat transport model that takes into account Joule heating and heat dissipation along the CNF, and assuming that breakdown occurs where the temperature reaches a threshold or critical value.
Keywords :
annealing; carbon fibres; electrical conductivity; interconnections; thermal conductivity; C; CNF breakdown; Joule heating; carbon nanofiber interconnects; critical value; current annealing; electrical transport; heat dissipation; high-current stress; thermal transport; Annealing; Carbon nanotubes; Contact resistance; Current density; Electric breakdown; Electrodes; Plasma measurements; Temperature; Thermal conductivity; Thermal stresses;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.91
