Analog and mixed-signal benchmark circuits-first release

Author

Kaminska, B. ; Arabi, K. ; Bell, I. ; Goteti, P. ; Huertas, J.L. ; Kim, B. ; Rueda, A. ; Soma, M.

Author_Institution

Opmaxx Inc., USA

fYear

1997

fDate

1-6 Nov 1997

Firstpage

183

Lastpage

190

Abstract

The IEEE Mixed-Signal Technical Activity Committee is developing a common set of benchmark circuits for use in researching and evaluating analog fault modeling, test generation, design-for-test, and built-in self-test methodologies. The first release circuits are based on MITEL Semiconductor´s 1.5 μm and 1.2 μm CMOS technologies and they will allow engineers and researchers working in analog and mixed-signal testing to compare test results as is done in the digital domain. This paper presents a set of typical circuits described by netlists in HSPICE format. Schematic diagrams, simulation results and measured results, if available, are provided together with layout and a typical test environment. The full details are available on the web page dedicated to analog and mixed-signal benchmarks

Keywords

CMOS analogue integrated circuits; SPICE; application specific integrated circuits; automatic test equipment; band-pass filters; digital-analogue conversion; mixed analogue-digital integrated circuits; performance evaluation; phase locked loops; switched capacitor filters; 1.2 mum; 1.5 mum; CMOS technologies; HSPICE format; IEEE Mixed-Signal Technical Activity Committee; MITEL Semiconductor; PLL; analog benchmarks; analog fault modeling; bandpass SC filter; built-in self-test; design-for-test; ladder DAC; mixed-signal benchmark circuits; netlists; simulation; test generation; Automatic testing; Benchmark testing; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Design for testability; Semiconductor device modeling; Semiconductor device testing; Technical activities;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639612

Filename

639612