Title :
Equivalent Single Conductor Modeling of Carbon Nanotube Bundles for Transient Analysis of High-Speed Interconnects
Author :
Amore, M.D. ; Ricci, M. ; Tamburrano, A.
Author_Institution :
Res. Center for Nanotechnol. Appl. to Eng., Univ. of Rome Sapienza, Rome
Abstract :
An equivalent single conductor (ESC) model is proposed for the time domain analysis of a CMOS gate driving a high speed interconnect consisting of a single wall carbon nanotube (SWCNT) bundle. The computed responses to a step-input voltage are compared to the ones of a multiconductor transmission line (MTL) model. The results obtained are in very good agreement. The 50% time delay tpd of the nano-interconnect is predicted by means the MTL and ESC model and by applying an analytical formulation. The sensitivity analysis of tpd is carried out with respect to the number of the conductive tubes in the bundle, the length and the terminal equivalent capacitance of the interconnect configuration.
Keywords :
CMOS integrated circuits; carbon nanotubes; delays; integrated circuit interconnections; multiconductor transmission lines; nanoelectronics; nanotube devices; C; CMOS gate; conductive tubes; equivalent single conductor model; equivalent single conductor modeling; high speed interconnect; high-speed interconnects; multiconductor transmission line model; single wall carbon nanotube bundle; step-input voltage; terminal equivalent capacitance; time delay; time domain analysis; transient analysis; Carbon nanotubes; Conductors; Delay effects; Multiconductor transmission lines; Predictive models; Semiconductor device modeling; Sensitivity analysis; Time domain analysis; Transient analysis; Voltage;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, Texas
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.98