DocumentCode :
2738669
Title :
On-Chip Compensated Error Amplifier for Fast Transient DC-DC Converters
Author :
Huang, Hong-Wei ; Ho, Hsin-Hsin ; Chang, Chia-Jung ; Chen, Ke-Horng ; Kuo, Sy-Yen
Author_Institution :
Graduate Inst. of Electron. Eng., National Taiwan Univ., Taipei
fYear :
2006
fDate :
7-10 May 2006
Firstpage :
103
Lastpage :
108
Abstract :
A novel on-chip compensated error amplifier for fast transient response of DC-DC converters is presented in this paper. The error amplifier uses on-chip current-mode Miller capacitor to replace a large off-chip capacitor. We only use three transistors and one voltage follower to implement this novel on-chip compensated error amplifier for fast transient DC-DC converters. Owing to the current-mode implementation, we can redirect the equivalent current to charge or discharge the output capacitor of the error amplifier to improve the transient response time. Not only on-chip compensated error amplifier is implemented without off-chip components and I/O pins, but also it can have fast transient response. The analytic equations guarantee the compensated correctness of the proposed circuit. With the proposed error amplifier, the transient response of DC-DC converters is improved significantly. Simulation results demonstrate the stability and the fast transient response of the DC-DC converters
Keywords :
DC-DC power convertors; capacitors; current-mode circuits; error compensation; operational amplifiers; transient response; DC-DC converters; current-mode Miller capacitor; current-mode implementation; error amplifier; fast transient response; off-chip capacitor; on-chip compensation; voltage follower; Capacitors; Circuits; DC-DC power converters; Energy consumption; Error correction; Load management; Time factors; Transconductance; Transient response; Voltage; Current-mode DC-DC converter; error amplifier; fast transient response; on-chip compensation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro/information Technology, 2006 IEEE International Conference on
Conference_Location :
East Lansing, MI
Print_ISBN :
0-7803-9592-1
Electronic_ISBN :
0-7803-9593-X
Type :
conf
DOI :
10.1109/EIT.2006.252169
Filename :
4017673
Link To Document :
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