DocumentCode :
2738757
Title :
Surface Profile Measurement Without Phase Stepping Using Feedback Interferometry
Author :
Somervel, A.N. ; Barnes, T.H.
Author_Institution :
University of Auckland
fYear :
1997
fDate :
14-18 July 1997
Firstpage :
271
Lastpage :
272
Keywords :
Charge carrier lifetime; Interferometers; Laser beam cutting; Laser feedback; Optical feedback; Optical interferometry; Optical polarization; Optical surface waves; Phase measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-3889-8
Type :
conf
DOI :
10.1109/CLEOPR.1997.610960
Filename :
610960
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2738757
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