DocumentCode
2738757
Title
Surface Profile Measurement Without Phase Stepping Using Feedback Interferometry
Author
Somervel, A.N. ; Barnes, T.H.
Author_Institution
University of Auckland
fYear
1997
fDate
14-18 July 1997
Firstpage
271
Lastpage
272
Keywords
Charge carrier lifetime; Interferometers; Laser beam cutting; Laser feedback; Optical feedback; Optical interferometry; Optical polarization; Optical surface waves; Phase measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-3889-8
Type
conf
DOI
10.1109/CLEOPR.1997.610960
Filename
610960
Link To Document