• DocumentCode
    2738919
  • Title

    Implementing HDI and Embedded Passives In A High-Reliability Aerospace Application

  • Author

    Holden, Happy

  • Author_Institution
    Mentor Graphics, Longmont, CO
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    82
  • Lastpage
    85
  • Abstract
    High Density Interconnects (HDI or microvias) have been around for over 20 years, the same is true for buried resistors. The implementation has been focused on small form-factor driven products like mobile phones and cameras. But with the increase use of fine-pitch BGAs (<0.8 mm) components and now, very high I/O BGAs (>2000 pins) with very fast rise-times, military and aerospace applications require the use of HDI as well. The paper also describes the training and phases of implementation, including reliability results and TH-redesign Benchmarks. One of the most useful new tools was a simulation program that was available to assist the designer in the selection of packaging configuration and EP materials. It provided modeling and simulation of interconnections and multilayer stackups for PCB circuit layout with a comparative costing of the density improvements and DFM manufacturability (while design time is reduced) in the use of HDI- microvias/EP over conventional through-hole technology.
  • Keywords
    ball grid arrays; circuit reliability; interconnections; printed circuit layout; printed circuit testing; printed circuits; HDI BGA fanout automation; PCB; aerospace application; assembly; embedded passives; high density interconnects; microvias; reliability testing; Cameras; Circuit simulation; Costing; Design for manufacture; Integrated circuit interconnections; Mobile handsets; Nonhomogeneous media; Packaging; Pins; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3623-1
  • Electronic_ISBN
    978-1-4244-3624-8
  • Type

    conf

  • DOI
    10.1109/IMPACT.2008.4783813
  • Filename
    4783813