DocumentCode :
2738956
Title :
Effect of Contacts on Quantum Transport in Nanostructures
Author :
Novakovic, B. ; Knezevic, I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
362
Lastpage :
365
Abstract :
In quasiballistic nanoscale devices, the process of relaxation towards a steady state cannot be attributed to carrier scattering. Rather, carrier exchange between the active region and the rapidly dephasing contacts is the mechanism governing relaxation. In this paper, we present a novel technique for the treatment of quantum transport in quasiballistic semiconductor nanostructures. The approach utilizes a first-principles model interaction between the current-limiting active region and the contacts. With the use of the model interaction and by accounting for the energy relaxation in the contacts due to the electron- electron interaction, irreversible evolution of the active region´s many body statistical operator is derived in the Markovian approximation. Specifically, analytical steady-state distribution functions are derived for a generic two-terminal nanostructure, and used to obtain the steady-state I-V curves for the cases of a resonant-tunneling diode and an nin diode.
Keywords :
Markov processes; ballistic transport; nanocontacts; nanostructured materials; quantum interference devices; quantum point contacts; resonant tunnelling diodes; Markovian approximation; carrier exchange; carrier scattering; electron- electron interaction; energy relaxation; nanostructured semiconductor; nanostructures; nin diode; quantum transport; quasiballistic nanoscale devices; resonant-tunneling diode; steady state; Contacts; Nanoscale devices; Particle scattering; Quantum computing; Resonance; Resonant tunneling devices; Semiconductor diodes; Semiconductor nanostructures; Steady-state; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.112
Filename :
4617094
Link To Document :
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