Title :
Trap-mediated, site-selective excitation of photoluminescence from multiple Er3+ sites in Er-implanted GaN
Author :
Kim, S. ; Rhee, S.J. ; Li, X. ; Coleman, J.J. ; Bishop, S.G. ; Klein, P.B.
Author_Institution :
Microelectron. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
Site-selective photoluminescence (PL) and photoluminescence excitation (PLE) spectroscopy have been carried out at 6 K on the ~1540 nm 4I13/2→4I15/2 emissions of Er3+ in Er-implanted MOCVD GaN. The PLE spectroscopy has detected several independent, site-selective excitation mechanisms which demonstrate the existence of four different Er3+ sites in Er-implanted GaN. Each of these four Er3+ sites exhibits a distinctive PL spectrum characteristic of that center´s environment when pumped by the appropriate wavelengths of below-gap light. Two of the site-selective Er3+ PL spectra pumped by trap-mediated excitation bands dominate the Er3+ PL spectrum excited by above-gap light. The PLE spectra demonstrate that the Er3+ PL spectra are excited by below gap absorption attributable to both implantation damage-induced defects and defects and impurities characteristic of the as-grown GaN. The temperature dependence of the Er3+ PL spectra was studied to examine thermal quenching properties of these site-specific Er3+ PL centers
Keywords :
III-V semiconductors; energy gap; erbium; gallium compounds; photoluminescence; wide band gap semiconductors; 1540 nm; 6 K; GaN:Er; multiple Er3+ sites; photoluminescence; thermal quenching properties; trap-mediated excitation bands; trap-mediated site-selective excitation; Absorption; Erbium; Gallium nitride; Laboratories; Luminescence; Microelectronics; Photoluminescence; Spectroscopy; Temperature; Thermal quenching;
Conference_Titel :
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7503-0556-8
DOI :
10.1109/ISCS.1998.711616