DocumentCode :
2739134
Title :
Fatigue Life Evaluation of Ball Grid Array Packages with Sn-Ag-Cu and Rare-Earth Addition Solder under Cyclic Bending Test
Author :
Cheng, Chih-Yuan ; Zhan, Chau-Jie ; Tung-Han, Chuang
Author_Institution :
Electron. & Optoelectron. Res. Labs., Ind. Technol. Res. Inst. (ITRI), Hsinchu
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
121
Lastpage :
124
Abstract :
The reliability of BGA assembly packages were evaluated by rapid fatigue life test. Three-point bend fatigue life test method has been developed for Sn-Ag-Cu 305 and rare-earth addition Sn-Ag-Cu-Ce solder joints. In this study, BGA assembly with Ni/Au surface finish was tested under cyclic bending load at room temperature. The bending fatigue life of Sn-Ag-Cu 305 solder joint was compared with rare-earth addition Sn-Ag-Cu-Ce solder joint. Experimental results showed that the failure mode of cyclic bending test was similar to thermal cycling test, and the rare-earth addition solder joint has lower bending fatigue life than Sn-Ag-Cu 305. Failure mode analysis showed that the crack failure was due to solder joint fatigue and was only propagating through the joint, but not through intermetallic compound (IMC). This study also established a real-time monitoring reliability test method. It can easily find the location of failure solder joint and precisely predict solder joint bending fatigue life.
Keywords :
cerium alloys; copper alloys; cracks; failure (mechanical); fatigue testing; gold; nickel; reliability; silver alloys; solders; tin alloys; Ni-Au; SnAgCu; SnAgCuCe; ball grid array packages; cyclic bending test; fatigue life evaluation; rapid fatigue life test; rare-earth addition solder; real-time monitoring reliability test method; reliability; room temperature; temperature 293 K to 298 K; three-point bend fatigue life test method; Assembly; Electronics packaging; Failure analysis; Fatigue; Gold; Intermetallic; Life testing; Soldering; Surface finishing; Temperature; Dynamic fatigue test; Rare-Earth addition solder; Reliability evaluation; Thermal cycling test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3623-1
Electronic_ISBN :
978-1-4244-3624-8
Type :
conf
DOI :
10.1109/IMPACT.2008.4783823
Filename :
4783823
Link To Document :
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