Development of X-band Magnetic Resonance Force Microscopy

Author

Toda, M. ; Ohno, N. ; Fujita, T. ; Kanemaki, T. ; Mitsudo, S. ; Ogawa, I. ; Idehara, T. ; Fujii, Y. ; Chiba, M. ; Lee, Y.J. ; Markert, J.T.

Author_Institution

Fukui Univ., Fukui

fYear

2006

fDate

18-22 Sept. 2006

Firstpage

298

Lastpage

298

Abstract

We report the modification of a X-band magnetic resonance force microscopy probe at our research center. We have newly developed a 3D(xyz)-piezo stage, which is made of titan, graphite, and commercial multilayer piezoelectric actuators. This piezo stage enables nanopositioning of a optical fiber and a sample at very low temperatures, and 3D scanning measurements. To achieve the higher spatial resolution, we have added the frequency stabilization system, which controls the microwave frequency within Deltaf ~100 kHz.

Keywords

frequency stability; magnetic force microscopy; probes; 3D scanning; 3D(xyz)-piezo stage; commercial multilayer piezoelectric actuators; frequency stabilization system; graphite; higher spatial resolution; titan; x-band magnetic resonance force microscopy; Frequency; Magnetic force microscopy; Magnetic multilayers; Magnetic resonance; Nanopositioning; Optical fibers; Piezoelectric actuators; Probes; Spatial resolution; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on

Conference_Location

Shanghai

Print_ISBN

1-4244-0400-2

Electronic_ISBN

1-4244-0400-2

Type

conf

DOI

10.1109/ICIMW.2006.368506

Filename

4222240