Title :
Current Status and Future Perspectives of Carbon Nanotube Interconnects
Author :
Banerjee, Kaustav ; Li, Hong ; Srivastava, Navin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
Abstract :
In this paper, we review the current status of CNT interconnect research, from both fabrication and modeling aspects. The fabrication issues of vertical and horizontal CNT interconnects and remaining challenges are discussed. State-of-the-art in both SWCNT and MWCNT modeling and performance analysis are presented. In addition, high-frequency effects, off-chip application, and process variation of CNT interconnects have also been discussed.
Keywords :
carbon nanotubes; high-frequency effects; integrated circuit interconnections; integrated circuit modelling; nanoelectronics; nanotube devices; C; MWCNT; SWCNT; high-frequency effects; horizontal carbon nanotube interconnects; off-chip application; vertical carbon nanotube interconnects; Carbon nanotubes; Current density; Fabrication; Large scale integration; Performance analysis; Scattering; Semiconductivity; Surface resistance; Thermal conductivity; Wires;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.132
