• DocumentCode
    2739424
  • Title

    A System-level Network-on-Chip Simulation Framework with Analytical Interconnecting Wire Models

  • Author

    Xi, Jinwen ; Zhong, Peixin

  • Author_Institution
    Dept. of ECE, Michigan State Univ., East Lansing, MI
  • fYear
    2006
  • fDate
    7-10 May 2006
  • Firstpage
    301
  • Lastpage
    306
  • Abstract
    This paper presents a system-level network-on-chip simulation framework employing transaction-level communication fabric models, such as routers and links, to achieve high simulation speed and provide NoC´s latency and throughput information. This framework integrates an analytical interconnecting wire model to estimate the wire delay and its overall influence to the system performance and power properties in early design stages. SystemC provides the infrastructure to integrate transaction-level NoC model and analytical wire model seamlessly, making it easy to refine. 6 deep-submicron CMOS processes from 180nm to 45nm are used to evaluate the performance/power of NoC considering the interconnecting wire models, and wire´s latency is estimated to be ~5X more than the router´s in sub-100nm processes, and it brings 33.1% in average bandwidth degradation. Temporal and spatial NoC power analysis with wire models under different traffics provides more power implications for designers in early design stages
  • Keywords
    CMOS integrated circuits; integrated circuit interconnections; integrated circuit modelling; network-on-chip; 45 to 180 nm; CMOS process; SystemC; bandwidth degradation; interconnecting wire models; network-on-chip; wire delay; Analytical models; Delay estimation; Fabrics; Network-on-a-chip; Performance analysis; Power system interconnection; Power system modeling; Semiconductor device modeling; Throughput; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/information Technology, 2006 IEEE International Conference on
  • Conference_Location
    East Lansing, MI
  • Print_ISBN
    0-7803-9592-1
  • Electronic_ISBN
    0-7803-9593-X
  • Type

    conf

  • DOI
    10.1109/EIT.2006.252176
  • Filename
    4017713