Title :
A self-test circuit for evaluating memory sense-amplifier signal
Author :
Adams, R. Dean ; Cooley, Edmond S. ; Hansen, Patrick R.
Author_Institution :
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
Abstract :
An on-chip self-test circuit to evaluate an analog sense-amplifier signal for static random-access memories was designed and analyzed. This circuit augments modern test equipment to achieve accuracy not previously possible
Keywords :
CMOS memory circuits; SRAM chips; automatic testing; digital simulation; integrated circuit testing; CMOS; SRAM; accuracy; analog sense-amplifier; memory sense-amplifier signal; self-test circuit; signal level compare circuit; static random-access memories; Built-in self-test; Circuit testing; Logic arrays; Random access memory; Read-write memory; Registers; Semiconductor device measurement; Signal design; Test equipment; Voltage;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639617
