Drive & Test System for 288 Ã\x97 4 TDI IRCCD

Author

Lai, Rui ; Zhou, Hui-xin ; Qin, Han-lin ; Liu, Shang-qian

Author_Institution

Xidian Univ., Xi´´an

fYear

2006

fDate

18-22 Sept. 2006

Firstpage

321

Lastpage

321

Abstract

The principle and the configuration of a new drive & test system for 288 X 4 TDI IRCCD are presented. It consists of a host-computer-subsystem (HCS) and a slave-computer-subsystem (SCS). The SCS is based on the single chip Micyoco and the field programmable gate array. The HCS completes the numerical-parameter input and sends them to the SCS. The SCS implements the parameter adjustment of the derive signal according to the data that are sent from the HCS or stored in the data-store unit. Moreover, the system can implement electronic injection test to the IRCCD. It is validated that some intrinsic defects of the traditional method, such as large size and poor reliability, are eliminated in this method.

Keywords

CCD image sensors; charge-coupled devices; circuit testing; driver circuits; electronic equipment testing; field programmable gate arrays; infrared detectors; microprocessor chips; satellite computers; HCS; SCS; TDI IRCCD; data-store unit; drive-circuit system; electronic injection; field programmable gate array; host-computer-subsystem; infrared charge couple device; single chip Micyoco; slave-computer-subsystem; Circuit synthesis; Circuit testing; Control system synthesis; Drives; Field programmable gate arrays; Signal generators; Signal synthesis; Switches; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on

Conference_Location

Shanghai

Print_ISBN

1-4244-0400-2

Electronic_ISBN

1-4244-0400-2

Type

conf

DOI

10.1109/ICIMW.2006.368529

Filename

4222263