DocumentCode
2739637
Title
Steps Towards Fabricating Cryogenic CMOS Compatible Single Electron Devices
Author
Eng, K. ; Eyck, G. A Ten ; Tracy, L. ; Nordberg, E. ; Childs, K. ; Stevens, J. ; Wendt, J.R. ; Lilly, M.P. ; Carroll, M.S.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
496
Lastpage
499
Abstract
We describe the development of a novel silicon quantum bit (qubit) device architecture that involves using materials that are compatible with a Sandia National Laboratories (SNL) 0.35 mum complementary metal oxide semiconductor (CMOS) process intended to operate at 100 mK. We describe how the qubit structure can be integrated with CMOS electronics, which is believed to have advantages for critical functions like fast single electron electrometry for readout compared to current approaches using radio frequency techniques. Critical materials properties are reviewed and preliminary characterization of the SNL CMOS devices at 4.2 K is presented.
Keywords
CMOS integrated circuits; elemental semiconductors; silicon; single electron devices; Si; complementary metal oxide semiconductor; cryogenic CMOS compatible single electron devices; radio frequency techniques; silicon quantum bit; single electron electrometry; temperature 4.2 K; CMOS process; Cryogenics; Gallium arsenide; Laboratories; Quantum computing; Quantum dots; Radio frequency; Silicon; Single electron devices; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.149
Filename
4617131
Link To Document