• DocumentCode
    2739637
  • Title

    Steps Towards Fabricating Cryogenic CMOS Compatible Single Electron Devices

  • Author

    Eng, K. ; Eyck, G. A Ten ; Tracy, L. ; Nordberg, E. ; Childs, K. ; Stevens, J. ; Wendt, J.R. ; Lilly, M.P. ; Carroll, M.S.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    496
  • Lastpage
    499
  • Abstract
    We describe the development of a novel silicon quantum bit (qubit) device architecture that involves using materials that are compatible with a Sandia National Laboratories (SNL) 0.35 mum complementary metal oxide semiconductor (CMOS) process intended to operate at 100 mK. We describe how the qubit structure can be integrated with CMOS electronics, which is believed to have advantages for critical functions like fast single electron electrometry for readout compared to current approaches using radio frequency techniques. Critical materials properties are reviewed and preliminary characterization of the SNL CMOS devices at 4.2 K is presented.
  • Keywords
    CMOS integrated circuits; elemental semiconductors; silicon; single electron devices; Si; complementary metal oxide semiconductor; cryogenic CMOS compatible single electron devices; radio frequency techniques; silicon quantum bit; single electron electrometry; temperature 4.2 K; CMOS process; Cryogenics; Gallium arsenide; Laboratories; Quantum computing; Quantum dots; Radio frequency; Silicon; Single electron devices; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.149
  • Filename
    4617131