DocumentCode
2739667
Title
2003 IEEE Radiation Effects Data Workshop
fYear
2003
fDate
25-25 July 2003
Abstract
The following topics are dealt with: ground-based, and in-flight single event effects on piece-part commercial off the shelf as well as space qualified components; total ionizing dose, including ELDRS and displacement damage; and proton and neutron test facilities in the United States, Canada, and Russia.
Keywords
integrated circuit testing; neutron effects; proton effects; radiation effects; radiation hardening (electronics); semiconductor device reliability; test facilities; Canada; ELDRS effects; Russia; United States; commercial off the shelf components; displacement damage; enhanced low dose rate sensitivity; ground-based single event effects; in-flight single event effects; ionizing dose; neutron test facilities; proton test facilities; radiation effects; space qualified components; Integrated circuit testing; Neutron radiation effects; Proton radiation effects; Radiation effects; Radiation hardening; Semiconductor device reliability; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2003. IEEE
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-8127-0
Type
conf
DOI
10.1109/REDW.2003.1281306
Filename
1281306
Link To Document