Title :
2003 IEEE Radiation Effects Data Workshop
Abstract :
The following topics are dealt with: ground-based, and in-flight single event effects on piece-part commercial off the shelf as well as space qualified components; total ionizing dose, including ELDRS and displacement damage; and proton and neutron test facilities in the United States, Canada, and Russia.
Keywords :
integrated circuit testing; neutron effects; proton effects; radiation effects; radiation hardening (electronics); semiconductor device reliability; test facilities; Canada; ELDRS effects; Russia; United States; commercial off the shelf components; displacement damage; enhanced low dose rate sensitivity; ground-based single event effects; in-flight single event effects; ionizing dose; neutron test facilities; proton test facilities; radiation effects; space qualified components; Integrated circuit testing; Neutron radiation effects; Proton radiation effects; Radiation effects; Radiation hardening; Semiconductor device reliability; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281306
