DocumentCode :
2739675
Title :
Lithographically Defined Si Nanowire Field Effect Transistors for Biochemical Sensing
Author :
Hu, Walter ; Yoon, Fern ; Regonda, Suresh ; Fernandes, Poornika ; Vogel, Eric M. ; Buyukserin, Fatih ; Zhao, Xiao-Mei ; Gao, Jinming
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Texas at Dallas, Richardson, TX
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
507
Lastpage :
508
Abstract :
A process integration of e-beam lithography, plasma etching, and Si processing have been developed to pattern Si nanowires on crystalline Si on insulator wafers. Si nanowires of 12-50 nm linewidth, 30-70 nm height, and 10 mum length have been made. Using these Si nanowires as conducting channels, field effect transistors using the back Si substrate as gate have been fabricated. Good I-V characteristics have been obtained. With the back-gate configuration, the surface of Si nanowires can be functionalized for biochemical sensing applications.
Keywords :
electron beam lithography; elemental semiconductors; field effect transistors; nanolithography; nanowires; silicon; sputter etching; I-V characteristics; Si; back-gate configuration; biochemical sensing; e-beam lithography; insulator wafers; nanowire field effect transistors; plasma etching; size 10 mum; size 30 nm to 70 nm; Crystallization; Etching; FETs; Fabrication; Lithography; Nanobioscience; Nanoscale devices; Plasma applications; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.152
Filename :
4617134
Link To Document :
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