Title :
Continuing evaluation of bipolar linear devices for total dose dependency and ELDRS effects
Author :
McClure, Steven S. ; Gorelick, Jerry L. ; Yui, Candice C. ; Rax, Bernard G. ; Wiedeman, Michael D.
Author_Institution :
Jet Propulsion Lab., Pasadena, CA, USA
Abstract :
We present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.
Keywords :
bipolar integrated circuits; integrated circuit testing; radiation effects; ELDRS effects; bipolar linear devices; dose rate dependency; enhanced low dose rate sensitivity; evaluation; total dose bias dependency; total dose dependency; Laboratories; Operational amplifiers; Performance evaluation; Propulsion; Regulators; Satellites; Semiconductor device manufacture; Telephony; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281310
