Title :
TID performance degradation of high precision, 16-bit analog-to-digital converters
Author :
Layton, Phil ; Williamson, Gale ; Patnaude, Ed ; Longden, Larry ; Thibodeau, Chad ; Kazak, Boris ; Sloan, Clarence
Author_Institution :
Maxwell Technol., San Diego, CA, USA
Abstract :
16-bit analog-to-digital (A/D) converters were evaluated for performance and linearity degradation due to the total dose induced shifts in the voltage reference. Test data and analysis of three A/D converters is presented.
Keywords :
analogue-digital conversion; integrated circuit testing; performance evaluation; reference circuits; 16-bit analog-to-digital converters; TID performance; high precision converters; linearity degradation evaluation; performance evaluation; total dose induced shifts; total ionizing dose; voltage reference; Analog-digital conversion; Circuits; Data analysis; Degradation; Linearity; Performance evaluation; Production; Protection; Software testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281314
