Title :
Finite element analysis and cryogenic experiment investigation of moving reflector sub-system
Author_Institution :
Chinese Acad. of Sci., Shanghai
Abstract :
Temperature distribution of moving reflector is obtained by finite element analysis. The cryogenic experimental result has shown that the hypothesis and analysis is reasonable.
Keywords :
cryogenics; finite element analysis; temperature distribution; cryogenic experiment investigation; finite element analysis; moving reflector subsystem; temperature distribution; Cryogenics; Finite element methods; Image analysis; Infrared imaging; Mirrors; Optical interferometry; Physics; Refrigeration; Temperature; Vacuum systems;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368536
