Title :
Recent radiation test results at JPL
Author :
Pritchard, Bruce E. ; Rax, Bernard G. ; McClure, Steven S.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper documents recent TID (including ELDRS) and proton damage test results obtained by JPL. Unusual test results, such as abnormally low or high failure levels or unusual failure or response mechanisms, are emphasized.
Keywords :
failure analysis; protons; radiation effects; semiconductor device reliability; ELDRS; JPL; Jet Propulsion Laboratory; TID; abnormally low failure level; displacement damage; enhanced low dose rate sensitivity; high failure level; proton damage test; radiation test; response mechanisms; total induced dose; Laboratories; Manufacturing processes; NASA; Performance evaluation; Process design; Propulsion; Protons; Semiconductor device testing; Space technology; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281317
