DocumentCode :
2739776
Title :
Degradation of commercially available DAC ICs in a mixed-radiation environment
Author :
Aghara, S. ; Fink, R.J. ; Charlton, W.S. ; Bhuva, B. ; Samadi, M.R. ; Ochoa, J.A. ; Porter, J.R.
Author_Institution :
Nucl. Eng. Teaching Lab., Texas Univ., Austin, TX, USA
fYear :
2003
fDate :
21-25 July 2003
Firstpage :
34
Lastpage :
37
Abstract :
Experiments were performed at several fluence levels in a mixed-radiation environment (fast neurons and gamma rays) to better understand electrical performance of digital to analog converters under irradiation. Procedures, facilities and results are presented.
Keywords :
CMOS integrated circuits; analogue-digital conversion; electron device testing; integrated circuit reliability; radiation effects; IC degradation; digital-analog converters; electrical performance; fast neurons; gamma rays; integrated circuits; irradiation; mixed-radiation environment; Circuits; Degradation; Digital signal processing; Digital-analog conversion; Laboratories; Microelectronics; Neutrons; Resistors; Switches; Telephony;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
Type :
conf
DOI :
10.1109/REDW.2003.1281318
Filename :
1281318
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2739776
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