Title :
Noise Analysis of Brush Scan Long Wave Infra-Red camera
Author :
Piding Li ; Yumin Li ; Zheng, Zheng
Author_Institution :
Univ. of Shanghai for Sci. & Technol., Shanghai
Abstract :
In this paper we introduce a new noise model based on the 3-D model to analyze the noise character of brush scan LWIR camera with long FPAs.
Keywords :
cameras; focal planes; infrared detectors; optical noise; optical testing; 3-D model; FPA; brush scan long wave infra-red camera; imaging system; noise analysis; noise testing; Brushes; Cameras; Circuit noise; Detectors; Focusing; Image analysis; Infrared imaging; Physics; System testing; Temperature;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368538
