DocumentCode
2739785
Title
Noise Analysis of Brush Scan Long Wave Infra-Red camera
Author
Piding Li ; Yumin Li ; Zheng, Zheng
Author_Institution
Univ. of Shanghai for Sci. & Technol., Shanghai
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
330
Lastpage
330
Abstract
In this paper we introduce a new noise model based on the 3-D model to analyze the noise character of brush scan LWIR camera with long FPAs.
Keywords
cameras; focal planes; infrared detectors; optical noise; optical testing; 3-D model; FPA; brush scan long wave infra-red camera; imaging system; noise analysis; noise testing; Brushes; Cameras; Circuit noise; Detectors; Focusing; Image analysis; Infrared imaging; Physics; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368538
Filename
4222272
Link To Document