DocumentCode
2739911
Title
Measurement of surface topography using microwave scanning techniques
Author
Husain, Anis ; Ash, Eric
Author_Institution
University College, London
Volume
11
fYear
1973
fDate
26877
Firstpage
370
Lastpage
371
Keywords
Dielectric devices; Dielectric thin films; Frequency; Microstrip; Microwave measurements; Microwave theory and techniques; Particle measurements; Surface cracks; Surface topography; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
1973 Antennas and Propagation Society International Symposium
Type
conf
DOI
10.1109/APS.1973.1147148
Filename
1147148
Link To Document