Title :
Measurement of surface topography using microwave scanning techniques
Author :
Husain, Anis ; Ash, Eric
Author_Institution :
University College, London
Keywords :
Dielectric devices; Dielectric thin films; Frequency; Microstrip; Microwave measurements; Microwave theory and techniques; Particle measurements; Surface cracks; Surface topography; Testing;
Conference_Titel :
1973 Antennas and Propagation Society International Symposium
DOI :
10.1109/APS.1973.1147148
