• DocumentCode
    2739944
  • Title

    Influence of Surface Stress on Bending Nanowires with Different Boundary Conditions

  • Author

    He, Jin ; Lilley, Carmen M.

  • Author_Institution
    Dept. of Mech. & Ind. Eng., Illinois Univ., Chicago, IL
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    565
  • Lastpage
    568
  • Abstract
    The influence of surface stress on the static and dynamic bending nanowires is investigated by incorporating the Young-Laplace equation into Euler-Bernoulli beam theory. The proposed theoretical approach gives explicit solutions for bending nanowires with two different boundary conditions - cantilever, and fixed-fixed. The solutions indicate that the nanowires behave as softer material for the cantilever structure and stiffer material for the fixed-fixed structure as the nanowire diameter decreases for a positive surface stress and a constant length. The surface stress influenced nanowire bending behavior is not only diameter dependent but also length dependent. Based on the proposed approach, nanowire overall Young´s modulus is calculated to exhibit the nanowire elastic bending behavior influenced by the surface stress. The theoretical calculations of the overall Young´s moduli agree with reported experiment results of Ag nanowires with diameter in the range of 38.7~135 nm and length in the range of 1-2.55 mum.
  • Keywords
    Young´s modulus; bending; nanowires; silver; stress-strain relations; Ag; Euler-Bernoulli beam theory; Young´s modulus; Young-Laplace equation; cantilever boundary condition; elastic bending; fixed-fixed boundary condition; nanowires; surface stress; Actuators; Boundary conditions; Differential equations; Helium; Industrial engineering; Mechanical systems; Nanoelectromechanical systems; Nanowires; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.167
  • Filename
    4617149