DocumentCode :
2739978
Title :
Mechanical Process Simulation of a Novel Metal-Nanowire-Film-based Flip Chip Technology
Author :
Cheng, H.C. ; Hsich, K.Y. ; Chen, W.H. ; Hsu, Y.C. ; Hsu, J.S. ; Uang, R.H.
Author_Institution :
Dept. of Aerosp. & Syst. Eng., Feng Chia Univ., Taichung
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
283
Lastpage :
286
Abstract :
The study aims at developing a next-generation flip chip (FC) packaging technology that employs a novel anisotropic conductive adhesive (ACF) made of unidirectional Co-nanowire-reinforced polymer nanocomposite, and moreover, exploring the associated process-induced, thermal-mechanical behaviors during bonding process. For carrying out the process simulation, a process-dependent finite element modeling (FEM) methodology is proposed. The investigation starts from the theoretical and experimental assessments of the elastic properties the nanoscale Co metal using molecular dynamics (MD) simulations and nanoindentation testing, respectively, followed by the determination of the thermal-mechanical material properties of the nanocomposite, using the proposed FEM-based effective modeling approach. The predicted results are compared with those obtained from the widely-used rule-of-mixture (ROM) technique and existing analytical models, and also, with those from experimental measurements. At last, factors that most influence on the thermal-mechanical behaviors of the novel technology are also investigated through parametric FE analysis and Taguchi method.
Keywords :
Taguchi methods; chip scale packaging; cobalt; elasticity; finite element analysis; flip-chip devices; indentation; integrated circuit bonding; mechanical testing; metallic thin films; molecular dynamics method; nanocomposites; nanowires; polymers; semiconductor process modelling; Co; FEM; Taguchi method; anisotropic conductive adhesive; bonding process; elastic property; finite element modeling; mechanical process simulation; metal nanowire film-based flip chip technology; molecular dynamics simulations; nanoindentation testing; next-generation flip chip packaging technology; parametric FE analysis; thermal mechanical property; unidirectional cobalt-nanowire-reinforced polymer nanocomposite; Anisotropic magnetoresistance; Bonding processes; Conductive adhesives; Finite element methods; Flip chip; Material properties; Materials testing; Packaging; Polymers; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3623-1
Electronic_ISBN :
978-1-4244-3624-8
Type :
conf
DOI :
10.1109/IMPACT.2008.4783866
Filename :
4783866
Link To Document :
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