Title :
Disturbance-free BIST for loop characterization of DC-DC buck converters
Author :
Beohar, Navankur ; Bakliwal, Priyanka ; Roy, Sidhanto ; Mandal, Debashis ; Adell, Philippe ; Vermeire, Bert ; Bakkaloglu, Bertan ; Ozev, Sule
Author_Institution :
Sch. of Electr., Comput., & Energy Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency. Unfortunately, they are also subject to higher process variations jeopardizing stable operation of the power supply. This paper presents a technique to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation using a white noise based excitation and correlation. White noise excitation is generated via pseudo random disturbance at reference and PWM input of the converter with the test signal energy being spread over a wide bandwidth, below the converter noise and ripple floor. Test signal analysis is achieved by correlating the pseudo random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402 is used as the DUT for the experimental verification. Experimental results show that the proposed technique can estimate converter´s natural frequency and Q-factor within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance.
Keywords :
DC-DC power convertors; built-in self test; integrated circuit noise; white noise; DC-DC buck converters; PWM input; converter noise; disturbance-free BIST; dynamic loop characteristic; load capacitance; load inductance; off-the-shelf power converter; pseudo random disturbance; pseudo random input sequence; ripple floor; test signal analysis; test signal energy; white noise based correlation; white noise based excitation; Capacitance; Correlation; DC-DC power converters; Frequency measurement; Noise; Pulse width modulation; Transfer functions;
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2015.7116250