Title :
Total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA
Author :
Cochran, Donna J. ; Kniffin, Scott D. ; LaBel, Kenneth A. ; O´Bryan, Martha V. ; Reed, Robert A. ; Ladbury, Ray L. ; Howard, James W., Sr. ; Poivey, Christian ; Buchner, Stephen P. ; Marshall, Cheryl J. ; Marshall, Paul W. ; Kim, Hak S. ; Hawkins, Donald
Author_Institution :
QSS Group Inc., Lanham, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include optoelectronics, digital, analog, linear bipolar devices, hybrid devices, analog-to-digital converters, and digital-to-analog converters, among others.
Keywords :
analogue integrated circuits; analogue-digital conversion; bipolar integrated circuits; digital integrated circuits; digital-analogue conversion; electronic equipment testing; hybrid integrated circuits; optoelectronic devices; radiation effects; space vehicle electronics; NASA; analog devices; analog-to-digital converters; candidate spacecraft electronics; device testing; digital devices; digital-to-analog converters; displacement damage; hybrid devices; linear bipolar devices; optoelectronics; total ionizing dose; Aerospace electronics; Degradation; Electronic equipment testing; NASA; Performance evaluation; Radiation effects; Space technology; Space vehicles; Telephony; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281345
