Title : 
Effect of nanowire lengths on polymer-Si nanowire hybrid solar cells
         
        
            Author : 
Dai-Hong Lin ; Shiu, Shu-Chia ; Huang, Jing-Shun ; Lin, Dai-Hong
         
        
            Author_Institution : 
Grad. Inst. of Photonics & Optoelectron., Nat. Taiwan Univ., Taipei, Taiwan
         
        
        
        
            Abstract : 
We demonstrate Al/Si NWs/poly(3,4-ethylenedioxy thiophene)/poly(styrenesulfonate)(PEDOT:PSS)/ITO hybrid solar cells. The lengths of these n-type Si NWs could be controlled by the etching time from 15min to 40min in an aqueous solution of AgNO3 and HF acid for this demonstration. The conductive polymer, PEDOT:PSS, was spin-coated on ITO glass. Before the PEDOT:PSS thin film dried, the top portion of the Si NWs were immersed in the wet PEDOT:PSS thin film. Current versus voltage measurements which were performed under broad band light irradiation show that Si NWs/PEDOT:PSS heterojunctions have remarkable photosensitive behavior. Moreover, when the nanowire etching time is raised, the probability of collecting photogenerated carriers at the interface after separation of hole-electron pair increases because of increasing interface area in the radial directions between the PEDOT:PSS and the silicon nanowire array, which palys an important role in collecting photogenerated electrons and acts as a conducting path to the aluminum electrode, resulting in raising fill factors and power conversion efficiencies.
         
        
            Keywords : 
nanowires; solar cells; spin coating; ITO glass; aluminum electrode; broad band light irradiation; nanowire lengths; polymer-Si nanowire hybrid solar cells; spin-coating; Etching; Heterojunctions; Photovoltaic cells; Photovoltaic systems; Polymers; Silicon;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
         
        
            Conference_Location : 
Honolulu, HI
         
        
        
            Print_ISBN : 
978-1-4244-5890-5
         
        
        
            DOI : 
10.1109/PVSC.2010.5614613