• DocumentCode
    2740456
  • Title

    In-flight observations of long-term single-event effect (SEE) performance on Orbview-2 solid state recorders (SSR)

  • Author

    Poivey, Christian ; Barth, Janet L. ; LaBel, Kenneth A. ; Gee, George ; Safren, Harvey

  • Author_Institution
    SGT-Inc., Greenbelt, MD, USA
  • fYear
    2003
  • fDate
    21-25 July 2003
  • Firstpage
    102
  • Lastpage
    107
  • Abstract
    We present multi-layer single event upset (SEU) flight data on solid state recorder (SSR) memories for the NASA Orbview-2 mission. Actual SEU rates are compared to the predicted rates based on ground test data and environment models.
  • Keywords
    radiation effects; recorders; space vehicle electronics; NASA Orbview-2 mission; Orbview-2 SSR; SSR memories; inflight observations; long-term SEE; multilayer SEU flight data; single-event effect; solid state recorders; Error correction codes; Fluctuations; Geoscience; NASA; Predictive models; Single event upset; Solid state circuits; Space vehicles; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2003. IEEE
  • Print_ISBN
    0-7803-8127-0
  • Type

    conf

  • DOI
    10.1109/REDW.2003.1281357
  • Filename
    1281357
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2740456