Title :
In-flight observations of long-term single-event effect (SEE) performance on Orbview-2 solid state recorders (SSR)
Author :
Poivey, Christian ; Barth, Janet L. ; LaBel, Kenneth A. ; Gee, George ; Safren, Harvey
Author_Institution :
SGT-Inc., Greenbelt, MD, USA
Abstract :
We present multi-layer single event upset (SEU) flight data on solid state recorder (SSR) memories for the NASA Orbview-2 mission. Actual SEU rates are compared to the predicted rates based on ground test data and environment models.
Keywords :
radiation effects; recorders; space vehicle electronics; NASA Orbview-2 mission; Orbview-2 SSR; SSR memories; inflight observations; long-term SEE; multilayer SEU flight data; single-event effect; solid state recorders; Error correction codes; Fluctuations; Geoscience; NASA; Predictive models; Single event upset; Solid state circuits; Space vehicles; Telephony; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281357
