• DocumentCode
    2740462
  • Title

    Single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation

  • Author

    Hiemstra, David M. ; Yu, Simon ; Pop, Marius

  • Author_Institution
    MDRobotics, Brampton, Ont., Canada
  • fYear
    2003
  • fDate
    21-25 July 2003
  • Firstpage
    108
  • Lastpage
    112
  • Abstract
    Experimental single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation is presented. Results are compared with previous tests on other x86 microprocessors.
  • Keywords
    microcomputers; microcontrollers; proton effects; system-on-chip; SEU characterization; personal computer microcontroller system-on-a-chip; proton irradiation; single event latchup; single event upset; total dose effects; x86 microprocessors; Application software; Microcomputers; Microprocessors; PROM; Protons; Single event upset; Space shuttles; System-on-a-chip; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2003. IEEE
  • Print_ISBN
    0-7803-8127-0
  • Type

    conf

  • DOI
    10.1109/REDW.2003.1281358
  • Filename
    1281358
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2740462