Title :
Single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation
Author :
Hiemstra, David M. ; Yu, Simon ; Pop, Marius
Author_Institution :
MDRobotics, Brampton, Ont., Canada
Abstract :
Experimental single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation is presented. Results are compared with previous tests on other x86 microprocessors.
Keywords :
microcomputers; microcontrollers; proton effects; system-on-chip; SEU characterization; personal computer microcontroller system-on-a-chip; proton irradiation; single event latchup; single event upset; total dose effects; x86 microprocessors; Application software; Microcomputers; Microprocessors; PROM; Protons; Single event upset; Space shuttles; System-on-a-chip; Telephony; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281358
