Title :
Characterization of SET response of the LM124A the LM111, and the LM6144
Author :
Savage, M.W. ; Turflinger, T. ; Titus, J.L. ; Pease, R.L. ; Poivey, C.
Author_Institution :
NAVSEA Surface Warfare Center Div., Crane, IN, USA
Abstract :
We present a paper that characterizes the single event transient response of the LM124, LM111, and LM6144 in a heavy ion environment. In the paper both the test methods used and the data are presented.
Keywords :
ion beam effects; operational amplifiers; transient response; LM111; LM124A; LM6144; SET response; device under test; heavy ion environment; operational amplifier; single event transient; test circuit; voltage reference; Circuit testing; FETs; Operational amplifiers; Probes; Pulse amplifiers; Pulse shaping methods; Relays; Senior members; Shape; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281361
