• DocumentCode
    2740558
  • Title

    Single event effects testing of the Linfinity SG1525A pulse width modulator controller

  • Author

    Howard, James W., Jr. ; Carts, Martin A. ; LaBel, Kenneth A. ; Forney, James D. ; Irwin, Timothy L.

  • Author_Institution
    Jackson & Tull Chartered Eng., Seabrook, MD, USA
  • fYear
    2003
  • fDate
    21-25 July 2003
  • Firstpage
    133
  • Lastpage
    140
  • Abstract
    The Linfinity SG1525A pulse width modulator controller was investigated for single event effects. No latchup events were observed but pulse dropouts and multiple consecutive pulses were observed. Additionally, experimental data collection methodology led to erroneous temporal overlap events being observed. The methodology and care needed to avoid these effects are discussed.
  • Keywords
    PWM power convertors; controllers; field effect transistors; integrated circuit testing; radiation effects; Linfinity SG1525A; PWM controller; SEE testing; erroneous temporal overlap events; field effect transistor; multiple consecutive pulses; pulse dropouts; pulse width modulator; single event effects; Circuit testing; Driver circuits; FETs; Frequency synchronization; Laser beams; Pulse circuits; Pulse width modulation; Pulsed power supplies; Space vector pulse width modulation; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2003. IEEE
  • Print_ISBN
    0-7803-8127-0
  • Type

    conf

  • DOI
    10.1109/REDW.2003.1281364
  • Filename
    1281364