Title :
Single event effects testing of the Linfinity SG1525A pulse width modulator controller
Author :
Howard, James W., Jr. ; Carts, Martin A. ; LaBel, Kenneth A. ; Forney, James D. ; Irwin, Timothy L.
Author_Institution :
Jackson & Tull Chartered Eng., Seabrook, MD, USA
Abstract :
The Linfinity SG1525A pulse width modulator controller was investigated for single event effects. No latchup events were observed but pulse dropouts and multiple consecutive pulses were observed. Additionally, experimental data collection methodology led to erroneous temporal overlap events being observed. The methodology and care needed to avoid these effects are discussed.
Keywords :
PWM power convertors; controllers; field effect transistors; integrated circuit testing; radiation effects; Linfinity SG1525A; PWM controller; SEE testing; erroneous temporal overlap events; field effect transistor; multiple consecutive pulses; pulse dropouts; pulse width modulator; single event effects; Circuit testing; Driver circuits; FETs; Frequency synchronization; Laser beams; Pulse circuits; Pulse width modulation; Pulsed power supplies; Space vector pulse width modulation; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281364
