DocumentCode
2740559
Title
Large-grain polysilicon MOSFET for 3-D integrated circuits
Author
Chan, Victor W.C. ; Chan, Philip C.H. ; Mansun Chan
Author_Institution
Dept. of Electr. & Electron. Dept., Hong Kong Univ. of Sci. & Technol., China
fYear
2000
fDate
2000
Firstpage
22
Lastpage
23
Abstract
The paper reports a large-grain polysilicon MOSFET that can be used to construct three dimensional circuits on SOI and bulk wafers. In this new technology, two layers of CMOS transistors are fabricated and separated by an insulating layer. When the devices of each layer are interconnected, a high performance 3D circuit can be realized. This results in the reduction of the interconnect length from microns to less than one micron, thus decreases the interconnect resistance and capacitance, and potentially increases the speed (Zhang et al., 1999). Moreover, if the NMOS devices are on the primary level and the PMOS devices are built on the second level, implant masking can be eliminated and the CMOS circuits can still be achieved
Keywords
CMOS integrated circuits; MOSFET; capacitance; electric resistance; elemental semiconductors; integrated circuit interconnections; silicon; 1 micron; 3D circuits; 3D integrated circuits; CMOS circuits; CMOS transistor layers; NMOS devices; PMOS devices; SOI wafers; Si-SiO2; bulk wafers; device layer interconnection; implant masking; insulating layer; interconnect capacitance; interconnect length; interconnect resistance; large-grain polysilicon MOSFET; CMOS process; CMOS technology; Crystallization; Implants; Integrated circuit interconnections; MOS devices; MOSFET circuits; Semiconductor films; Silicon; Three-dimensional integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2000 IEEE International
Conference_Location
Wakefield, MA
ISSN
1078-621X
Print_ISBN
0-7803-6389-2
Type
conf
DOI
10.1109/SOI.2000.892750
Filename
892750
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