DocumentCode :
2740582
Title :
Pseudo-nMOS revisited: impact of SOI on low power, high speed circuit design
Author :
Subba, Niraj ; Salman, Akram ; Mitra, Souvick ; Ioannou, Dimitris E. ; Tretz, Christophe
Author_Institution :
Dept. of Electr. & Comput. Eng., George Mason Univ., Fairfax, VA, USA
fYear :
2000
fDate :
2000
Firstpage :
26
Lastpage :
27
Abstract :
Bulk pseudo-nMOS (i.e. CMOS with grounded pMOS pullup device) circuits have been quite popular in the past because they are fast, small and pMOS devices are good pullup resistive loads. A pseudo-nMOS gate with a fan-in of N requires only N+1 transistors (as opposed to 2N for standard CMOS), resulting in smaller area as well as smaller parasitic capacitances, whereas each input connects to only one transistor, presenting a smaller load to the preceding gate. Since these advantages come at the expense of static power consumption, pseudo-nMOS circuits have often lost their appeal for large circuits, even though they are frequently used in some critical path elements when speed and area are at a premium (Weste and Eshraghian, 1993). If a weaker pMOS load transistor could be used without sacrificing speed, for example by reducing the load on the dotted node (either due to smaller devices in the pulldown tree, or to a smaller driven load representing a similar gate), the static power could be minimized. Since from a circuit designer´s perspective, one of the major advantages of SOI technology is the reduction of junction capacitance, this paper takes a fresh look at pseudo-nMOS and finds that SOI technology makes possible important performance (speed and power) and area improvements and predicts that it can be used widely in the design of SOI custom-integrated circuits
Keywords :
CMOS integrated circuits; application specific integrated circuits; capacitance; circuit simulation; high-speed integrated circuits; integrated circuit design; low-power electronics; silicon-on-insulator; CMOS; SOI; SOI custom-integrated circuit design; SOI pseudo-nMOS ICs; SOI technology; Si-SiO2; circuit design; critical path elements; dotted node load; driven load; grounded pMOS pullup device; high speed circuit design; junction capacitance; low power circuit design; pMOS device pullup resistive loads; pMOS load transistor; parasitic capacitance; pseudo-nMOS circuits; pseudo-nMOS gate fan-in; pulldown tree devices; static power consumption; static power minimization; wafer area; Circuit noise; Circuit synthesis; Energy consumption; Frequency; MOS devices; Paper technology; Parasitic capacitance; Power dissipation; Power engineering and energy; Power engineering computing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 2000 IEEE International
Conference_Location :
Wakefield, MA
ISSN :
1078-621X
Print_ISBN :
0-7803-6389-2
Type :
conf
DOI :
10.1109/SOI.2000.892752
Filename :
892752
Link To Document :
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