Title :
Proton irradiation testing of ATMEL 68360 processor and GaAs MMICs
Author :
Seon, J. ; Kim, S.J. ; Min, S.H. ; Lee, Y.M. ; Park, J.W. ; Min, K.W. ; Chung, T.J. ; Chun, H.J.
Author_Institution :
SaTReCi Co. Ltd., Daejeon, South Korea
Abstract :
Proton irradiation testing was performed for ATMEL 68360 processor and GaAs MMICs. ATMEL 68360 showed a few SEE and suffered permanent functional failure near 20 krad (Si). No SEE and a little TID effect occur in these MMICs. The results show sufficient qualification of the components for Korean space missions.
Keywords :
MMIC; aerospace control; gallium arsenide; microcomputers; proton effects; space vehicle electronics; ATMEL 68360 processor; GaAs; GaAs MMICs; Korean space missions; MACSAT; Si; TID effect; attitude determination; control software; flight software; medium-sized aperture camera satellite; monolithic microwave integrated circuits; on-board computer; permanent functional failure; proton irradiation testing; single event effect; total ionizing dose; Fingers; Gallium arsenide; MMICs; Performance evaluation; Performance gain; Protons; Satellite broadcasting; Software performance; Software testing; System testing;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281371
