DocumentCode
2740688
Title
Compendia of TID and SEE test results of space qualified integrated circuits
Author
Layton, Phil ; Williamson, Gale ; Patnaude, Ed ; Longden, Larry ; Thibodeau, Chad ; Kazak, Boris ; Sloan, Clarence
Author_Institution
Maxwell Technol., San Diego, CA, USA
fYear
2003
fDate
21-25 July 2003
Firstpage
169
Lastpage
174
Abstract
SEE and TID data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Keywords
integrated circuit testing; integrated circuits; radiation effects; space vehicle electronics; SEE testing; TID testing; heavy ion accelerator facilities; radiation effects; single event effects; single event latchup; single event upset; space environments; space products; space qualified integrated circuits; total ionizing dose; Circuit testing; Cyclotrons; Integrated circuit technology; Integrated circuit testing; Performance evaluation; Production; Radiation effects; Single event upset; Space technology; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN
0-7803-8127-0
Type
conf
DOI
10.1109/REDW.2003.1281372
Filename
1281372
Link To Document