DocumentCode :
2740738
Title :
Challenges to Crossbar Integration of Nanoscale Two-Terminal Symmetric Memory Devices
Author :
Dong, Mian ; Zhong, Lin
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
692
Lastpage :
694
Abstract :
Crossbar is the most efficient architecture to organize memory devices into dense, large-scale arrays. Emerging nanotechnology promises two-terminal, symmetric memory devices of superior electrical properties. In this work, however, we show that these two-terminal, symmetric devices impose grave challenges to the crossbar-based memory organization. First, we prove that conventional crossbar organization will not work for such symmetric devices. Second, we propose a revised crossbar organization that does work for such devices. However, diodes or switches must be employed to convert such devices into asymmetrical devices in order to avoid considerable energy cost, which can significantly discount their advantage over conventional asymmetrical devices. Third, we demonstrate that there is significant difference in delay and power consumption for accessing a memory device of different contents, i.e., 0 or 1. Such difference constitutes a performance bottleneck of crossbar- based integration of resistive memory devices.
Keywords :
delays; integrated memory circuits; nanoelectronics; crossbar integration; crossbar-based memory organization; delay; electrical properties; nanoscale two-terminal symmetric memory devices; performance bottleneck; power consumption; resistive memory devices; Delay; Diodes; Energy consumption; Large scale integration; Nanoscale devices; Nanotechnology; Solids; Switches; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, Texas
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.209
Filename :
4617191
Link To Document :
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