Title :
A BIST Approach for Configurable Nanofabric Arrays
Author :
Joshi, Mandar V. ; Al-Assadi, Waleed K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO
Abstract :
This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
Keywords :
built-in self test; nanoelectronics; nanowires; programmable logic arrays; BIST approach; built-in self test; configurable nanofabric arrays; crossbars; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit interconnections; Logic arrays; Nanowires; Programmable logic arrays; Redundancy; Test pattern generators;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.210
