• DocumentCode
    2740755
  • Title

    A BIST Approach for Configurable Nanofabric Arrays

  • Author

    Joshi, Mandar V. ; Al-Assadi, Waleed K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    695
  • Lastpage
    698
  • Abstract
    This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
  • Keywords
    built-in self test; nanoelectronics; nanowires; programmable logic arrays; BIST approach; built-in self test; configurable nanofabric arrays; crossbars; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit interconnections; Logic arrays; Nanowires; Programmable logic arrays; Redundancy; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.210
  • Filename
    4617192
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2740755