• DocumentCode
    2740823
  • Title

    Decoupling charge carrier collection and metallization geometry of back-contacted back-junction silicon solar cells by using insulating thin films

  • Author

    Reichel, C. ; Reusch, M. ; Granek, F. ; Hermle, M. ; Glunz, S.W.

  • Author_Institution
    Fraunhofer Inst. for Solar Energy Syst. (ISE), Freiburg, Germany
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Back-contacted back-junction silicon solar cells with a large emitter coverage (point-like base contacts) and a small emitter coverage (point-like emitter and base contacts) have been fabricated and analyzed. These solar cells feature an insulating thin film on the rear side in order to decouple the charge carrier collection geometry and the geometry of the metallization. It has been found, that for the investigated solar cells an increased collection efficiency is observed due to a significant reduction of electrical shading losses. Thus, high short-circuit currents could be achieved for both solar cell structures. Different insulating thin films, such as ALD Al2O3 and PECVD SiOx have been investigated. It has been found that ALD layers are already insulating for a thinner film thickness. By applying these insulating thin films to the investigated solar cell structures no significant shunts are introduced. For solar cells on 1 Ωcm n-type material and with a large emitter coverage an efficiency of 21.9% (Voc = 673 mV, Jsc = 40.6 mA/cm2, FF = 80.1%) could be obtained and for solar cells with a small emitter coverage an efficiency of 22.7% (Voc = 706 mV, Jsc = 41.0 mA/cm2, FF = 78.5%) has been achieved.
  • Keywords
    aluminium compounds; atomic layer deposition; elemental semiconductors; insulating thin films; plasma CVD; short-circuit currents; silicon; silicon compounds; solar cells; Al2O3; SiO; back-contacted back-junction silicon solar cells; charge carrier collection geometry; electrical shading losses; emitter coverage; insulating thin films; metallization geometry; short-circuit currents; Aluminum oxide; Leakage current; Metallization; Photovoltaic cells; Photovoltaic systems; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614640
  • Filename
    5614640