Title :
GaP Raman Terahertz (GRT) Spectrometer using High Resolution Cr:forsterite Lasers
Author :
Nishizawa, J. ; Suto, K. ; Shibata, J. ; Sasaki, T. ; Ito, M. ; Watanabe, H. ; Tanabe, T.
Author_Institution :
Semicond. Res. Inst., Sendai
Abstract :
We have developed high resolution GaP Raman THz (GRT) spectrometer using Cr:forsterite lasers with gratings. Line-width below 1.5 GHz and wide tunable frequency range (0.6 -6.2 THz) of the GRT enables to measure materials which have sharp absorption bands, such as gases or solid samples at low temperature with sufficient resolution.
Keywords :
III-V semiconductors; Raman spectroscopy; chromium; gallium compounds; magnesium compounds; measurement by laser beam; solid lasers; submillimetre wave spectroscopy; GaP; Mg2SiO4:Cr; Raman terahertz spectrometer; frequency 0.6 THz to 6.2 THz; gratings; high resolution Cr:forsterite lasers; Absorption; Frequency measurement; Gas lasers; Gases; Gratings; Optical materials; Raman scattering; Solids; Spectroscopy; Tunable circuits and devices;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368617
