• DocumentCode
    2741234
  • Title

    A general framework for robust compressive sensing based nonlinear regression

  • Author

    Moore, Brian ; Natarajan, Balasubramaniam

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Kansas State Univ., Manhattan, KS, USA
  • fYear
    2012
  • fDate
    17-20 June 2012
  • Firstpage
    225
  • Lastpage
    228
  • Abstract
    In this paper, we present a general framework for robust nonlinear regression that leverages concepts from the field of compressive sensing to simultaneously detect outliers and determine optimally sparse representations of noisy data from arbitrary sets of basis functions. Our framework employs a two-component noise model and compressive sensing recovery techniques to exploit the inherent sparsity of outliers while (optionally) performing model order reduction over all predictive variables and basis functions. As such, our algorithm can de-emphasize the effect of predictive variables that become uncorrelated with the measurement data. This desirable property has various applications like real-time detection of faulty sensors and sensor jamming in wireless sensor networks. After developing our framework and making the connection to compressive sensing theory, we present simulations that demonstrate the superior performance of our framework with respect to classic robust regression techniques like least absolute value and iteratively reweighted least-squares.
  • Keywords
    compressed sensing; jamming; prediction theory; regression analysis; wireless sensor networks; basis function; compressive sensing recovery technique; faulty sensor; noisy data; nonlinear regression; outlier detection; predictive variable; robust compressive sensing; sensor jamming; two component noise model; wireless sensor networks; Compressed sensing; Mathematical model; Noise; Noise measurement; Pollution measurement; Robustness; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensor Array and Multichannel Signal Processing Workshop (SAM), 2012 IEEE 7th
  • Conference_Location
    Hoboken, NJ
  • ISSN
    1551-2282
  • Print_ISBN
    978-1-4673-1070-3
  • Type

    conf

  • DOI
    10.1109/SAM.2012.6250474
  • Filename
    6250474