• DocumentCode
    2741292
  • Title

    Comparative analysis of PD-SOI active body-biasing circuits

  • Author

    Casu, R. ; Masera, G. ; Piccinini, C. ; Roch, M. Ruo ; Zamboni, M.

  • Author_Institution
    Dept. of Electron., Politecnico di Torino, Italy
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    94
  • Lastpage
    95
  • Abstract
    The body of SOI partially depleted MOSFETs can be biased to control the threshold dynamically. In the dynamic threshold MOSFET (DTMOS) (Assaderaghi et al, 1997), the operation is limited to about V dd=0.7 V because of the forward bias of the B-D and B-S junctions. Active body-biasing circuits (ABC-SOI) use auxiliary transistors to implement the bias circuitry and to increase the Vdd limit (Chuang et al., 1998; Chung et al., 1997; Gil et al., 1998; Lee et al., 1998). In this paper, previously reported and new ABCs are analyzed. The speed-power trade-off and the delay stability, one of the most peculiar PD problems, are examined in several operating conditions
  • Keywords
    MOS integrated circuits; MOSFET; active networks; circuit simulation; circuit stability; delays; high-speed integrated circuits; logic gates; low-power electronics; silicon-on-insulator; 0.7 V; ABC-SOI; B-D junction; B-S junction; DTMOS; PD-SOI active body-biasing circuits; SOI partially depleted MOSFET body bias; SOI partially depleted MOSFETs; Si-SiO2; active body-biasing circuits; auxiliary transistors; bias circuitry; delay stability; dynamic threshold MOSFET; dynamic threshold control; forward bias; operating conditions; speed-power trade-off; Circuit simulation; Circuit stability; Circuit testing; Delay; Diodes; Energy consumption; Immune system; Inverters; Stability analysis; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 2000 IEEE International
  • Conference_Location
    Wakefield, MA
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-6389-2
  • Type

    conf

  • DOI
    10.1109/SOI.2000.892786
  • Filename
    892786