DocumentCode :
2741442
Title :
Low energy proton implantation techniques for coverglass irradiation qualification
Author :
Messenger, S.R. ; Trautz, K. ; Walters, R.J. ; Jones, G. ; Hall, J. ; Schuur, J.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fYear :
2010
fDate :
20-25 June 2010
Abstract :
It is demonstrated that the two hydrogen concentration profiles and the associated effects on solar cell coverglass degradation created at equivalent atomic fluences of 7.4×1015 particles/cm2 using 30 keV proton (H+) and 60 keV diatomic hydrogen ion (H2+) implantation on solar cell coverglass material are nearly identical. Both Monte Carlo simulation and experimental results support this contention to the level of acceptable experimental error, thereby enabling coverglass radiation testing to be performed using the latter, more cost effective option.
Keywords :
Monte Carlo methods; proton effects; solar cells; Monte Carlo simulation and; coverglass degradation; coverglass irradiation qualification; hydrogen concentration profile; proton implantation technique; solar cell; Degradation; Glass; Photovoltaic cells; Protons; Radiation effects; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5614673
Filename :
5614673
Link To Document :
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