Title :
Design and Manufacturing of a Fourier Transform Microspectrometer
Author :
Das, Aditya N. ; Sin, Jeongsik ; Popa, Dan O. ; Stephanou, Harry E.
Author_Institution :
Autom. & Robot. Res. Inst., Univ. of Texas at Arlington, Arlington, TX
Abstract :
Spectrometry has long been used for measuring chemical compositions and purity of materials in industrial, medical and environmental applications by detecting material dependent absorption of wavelength. Traditional spectrometers, however, are table-top instruments, and they are generally too large, and too costly to be ported outside of lab environments. Micro-electro-mechanical-systems (MEMS) technology offers promising possibilities to build compact and cost-effective miniature instruments, including spectrometers. In this paper, we present a fiber-coupled Fourier-transform microspectrometer of a nominal size of 3 cm times 3 cm times 3 cm, constructed using 3D hybrid microassembly. The microspectrometer targets wavelengths in the Visible and NIR spectra. We use modular microscale parts, including minimum energy compliant MEMS fasteners, in order to configure a die-sized microoptical bench. A scanning micromirror is snapped into a MEMS thermal actuator, and we measure interference fringes from a Michelson interferometer. Light coupling, miniature electronics and power are included in the spectrometer package. We discuss the design, robotic assembly, packaging and experimental characterization of this MEMS-based instrument.
Keywords :
Fourier transform spectrometers; Michelson interferometers; infrared spectrometers; infrared spectroscopy; interference; microassembling; micromechanical devices; packaging; robotic assembly; 3D hybrid microassembly; Fourier transform microspectrometer; MEMS fasteners; MEMS packaging; MEMS technology; MEMS thermal actuator; Michelson interferometer; NIR spectra; die-sized microoptical bench; interference fringes; light coupling; microelectromechanical systems; miniature electronics; robotic assembly; scanning micromirror; visible spectra; Absorption; Chemical industry; Composite materials; Electronic packaging thermal management; Fourier transforms; Instruments; Manufacturing industries; Micromechanical devices; Spectroscopy; Wavelength measurement;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.249