• DocumentCode
    2741597
  • Title

    A high speed and low power phase-frequency detector and charge-pump

  • Author

    Lee, Won-Hyo ; Cho, Jun-dong ; Lee, Sung-Dae

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Sungkyunkwan Univ., Kyunggi, South Korea
  • fYear
    1999
  • fDate
    18-21 Jan 1999
  • Firstpage
    269
  • Abstract
    In this paper, we introduce a high-speed and low power Phase-Frequency Detector (PFD) that is designed using modified TSPC (True Single-Phase Clock) positive edge triggered D flip-flop. This PFD has a simpler structure with using only 19 transistors. The operation range of this PFD is over 1.2 GHz without additional prescaler circuits. Furthermore, the PFD has a dead zone less than 0.01 ns in the phase characteristics and has low phase sensitivity errors. The phase and frequency error detection range is not limited as in the case of the pt-type and nc-type PFDs. Also, the PFD is independent from the duty cycle of input signals. A new charge-pump circuit is presented that is designed using a charge-amplifier. A stand-by current enhances the speed of charge-pump and removes the charge-sharing which causes a phase noise in the charge-pump PLL. Also, the effects of clock feed-through are reduced by separating the output stage from UP and down signal. The simulation results base on a third-order PLL are presented to verify the lock-in process with the proposed PFD and charge-pump circuits. The PFD and charge-pump circuits are designed using 0.8 μm CMOS technology with 5 V supply voltage
  • Keywords
    CMOS integrated circuits; error detection; flip-flops; phase detectors; phase locked loops; 0.01 ns; 0.8 mum; 1.2 GHz; 5 V; CMOS technology; charge-amplifier; charge-pump; charge-pump circuit; clock feed-through; dead zone; detection range; duty cycle; high speed; low phase sensitivity errors; low power phase-frequency detector; modified TSPC; output stage; phase characteristics; phase noise; positive edge triggered D flip-flop; simulation; stand-by current; third-order PLL; true single-phase clock; CMOS technology; Charge pumps; Circuit simulation; Clocks; Flip-flops; Phase detection; Phase frequency detector; Phase locked loops; Phase noise; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific
  • Conference_Location
    Wanchai
  • Print_ISBN
    0-7803-5012-X
  • Type

    conf

  • DOI
    10.1109/ASPDAC.1999.760011
  • Filename
    760011