FITD Simulation of Terahertz Near-Field Microscopes

Author

Lee, K. ; Yun, S. ; Cho, M. ; Park, H. ; Kim, J. ; Han, H. ; Park, I.

Author_Institution

Pohang Univ. of Sci. & Technol., Pohang

fYear

2006

fDate

18-22 Sept. 2006

Firstpage

435

Lastpage

435

Abstract

The spatial resolutions of conventional THz TDS systems are limited by diffraction. In this work, we present a numerical analysis of apertureless THz pulse near-field microscopy (NFM), and successfully demonstrate that the THz NFM can have nanometer-scale resolution. For the numerical analysis we used CST MWS, a commercial software based on finite integral time domain (FITD) method. It is found that the THz near field is strongly localized around the probe tip as expected, which is of importance for nanometer resolution.

Keywords

finite difference time-domain analysis; light diffraction; near-field scanning optical microscopy; FITD simulation; finite integral time domain; light diffraction; nanometer scale resolution; numerical analysis; pulse near field microscopy; spatial resolutions; terahertz near field microscopes; Biotechnology; Diffraction; Energy resolution; Integral equations; Microscopy; Nanotechnology; Numerical analysis; Probes; Spatial resolution; Submillimeter wave technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on

Conference_Location

Shanghai

Print_ISBN

1-4244-0400-2

Electronic_ISBN

1-4244-0400-2

Type

conf

DOI

10.1109/ICIMW.2006.368643

Filename

4222377