DocumentCode :
2741655
Title :
Computer Integrated Plasma Nano Manufacturing Workcell
Author :
Zhang, Jiangbo ; Lai, King W C ; Narendra, Jeffri ; Xi, Ning ; Grotjohn, Timothy ; Asmussen, Jes
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
861
Lastpage :
864
Abstract :
As a very important material processing technology, plasma processing is able to modify sample surface through etching, deposition, activation, functionalization, polymerization, etc. However, the general plasma processing reacts on a large area of sample surface. Hence a mask is needed for selectively treating the sample surface. In this paper, a computer integrated plasma nano manufacturing workcell is developed, which consists of a micro plasma source and an integrated Atomic Force Microscopy (AFM) nanomanipulation system. The miniature microwave plasma discharge applicator is able to create a miniature plasma stream with a diameter ranges from 2 millimeters down to micrometers. Hence the micro plasma will be able to locally treat a sample surface and has the potential to eliminate the requirement of masks. With the integrated AFM system, the sample surface is able to be inspected and further modified at nanoscale in the same chamber after machined by the micro plasma. The system design and implementation are presented in the paper. Experiments have been carried out to demonstrate the effectiveness of the system by locally etching a silicon substrate surface using the micro plasma source.
Keywords :
atomic force microscopy; computer integrated manufacturing; elemental semiconductors; masks; nanotechnology; plasma sources; silicon; sputter etching; Si; computer integrated plasma nanomanufacturing workcell; etching; integrated atomic force microscopy; mask; microplasma source; microwave plasma discharge applicator; nanomanipulation system; plasma material processing; plasma stream; polymerization; silicon substrate surface; Atomic force microscopy; Computer aided manufacturing; Computer integrated manufacturing; Etching; Plasma applications; Plasma materials processing; Plasma sources; Polymers; Surface discharges; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.257
Filename :
4617239
Link To Document :
بازگشت