• DocumentCode
    2741732
  • Title

    Ion implanted GaAs/InGaAs lateral injection ridge QW laser for OEICs: study of operation mechanisms

  • Author

    Tager, A.A. ; Gaska, R. ; Avrutsky, I.A. ; Fay, M. ; Chik, H. ; Springthorpe, A. ; Husain, Z. ; Xu, J.M. ; Shu, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • fYear
    1997
  • fDate
    8-11 Sep 1997
  • Firstpage
    387
  • Lastpage
    390
  • Abstract
    We have fabricated and characterized lateral current injection (LCI) ridge-waveguide lasers with implanted contacts. Comprehensive optical and electrical measurements have been performed over a wide temperature range (10 K to 300 K) on two sets of lasers with differing ridge widths and active region structures. Several new phenomena unique to the LCI mechanism have been observed and explained, including a positive differential resistance kink at threshold, and an inverse temperature-dependence of quantum efficiency and threshold current at cryogenic values. Electron/hole mobility disparity, local carrier nonpinning above threshold due to photon-assisted carrier diffusion, and intrinsically higher current densities have been experimentally identified as the major factors governing LCI laser characteristics. The results have important implications for optimum LCI laser design and ultimate performance
  • Keywords
    III-V semiconductors; carrier lifetime; carrier mobility; charge injection; current density; gallium arsenide; indium compounds; integrated optoelectronics; ion implantation; quantum well lasers; ridge waveguides; semiconductor quantum wells; waveguide lasers; 10 to 300 K; GaAs-InGaAs; GaAs/InGaAs; OEIC; active region structure; current density; electrical measurements; electron/hole mobility disparity; implanted contacts; ion implanted lateral injection ridge QW laser; lateral current injection ridge-waveguide lasers; local carrier nonpinning; operation mechanisms; optical measurements; photon-assisted carrier diffusion; positive differential resistance kink; quantum efficiency; ridge width; temperature dependence; threshold current; Contacts; Electric resistance; Electric variables measurement; Electrical resistance measurement; Gallium arsenide; Indium gallium arsenide; Particle beam optics; Performance evaluation; Temperature distribution; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 1997 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7503-0556-8
  • Type

    conf

  • DOI
    10.1109/ISCS.1998.711668
  • Filename
    711668